| 发明名称 |
NONNDESTRUCTIVE INSPECTION APPARATUS |
| 摘要 |
PURPOSE:Two inspection mechanisms are disposed in the specimen carrying direction, whereby perfect flaw inspection is made possible without being affected by the shape or the direction of curved parts of the specimen such as pressed products. |
| 申请公布号 |
JPS5254486(A) |
申请公布日期 |
1977.05.02 |
| 申请号 |
JP19750129863 |
申请日期 |
1975.10.30 |
| 申请人 |
TOKYO SHIBAURA ELECTRIC CO |
发明人 |
OOISHI MINEO;FUJII MASAJI |
| 分类号 |
G01N23/18 |
主分类号 |
G01N23/18 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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