发明名称 DEFECT INSPECTING APPARATUS
摘要 PURPOSE:Signals of a predetermined level are detected, the number of these detected signals is integrated and a defect detecting signal is obtained when the integrated value reaches a predetermined value, whereby easy setting of detection sensitivity to higher sensitivity is made possible and false detection is reduced.
申请公布号 JPS5254484(A) 申请公布日期 1977.05.02
申请号 JP19750130066 申请日期 1975.10.28
申请人 TATEISI ELECTRONICS CO 发明人 MORITA TAKANOBU;HASEBE TOU;TANIMOTO FUSAO
分类号 G01N21/89;G01N21/892 主分类号 G01N21/89
代理机构 代理人
主权项
地址