| 摘要 |
<p>A stylometer stand for precision measurement, e.g. for measuring the thickness of a work piece lying on a horizontal support, has a base (4) resting on the support (2) and a vertical measurement frame (7) with a height adjustable arm (9) carrying a dial gauge and measuring probe (11). The arm to be clamped in various positions to allow for dimension variation, and to avoid displacement of the stylometer probe during adjustment. The probe can be very accurately positioned. An inclined plane supporting the stand (7) allows sideways adjustment of the stand and probe.</p> |
