| 摘要 |
PURPOSE:To enable highly-precise measurement of an absolute value of the number of lattices of a single crystal irrespective of the kind of the crystal by applying X-ray beams of different wavelengths to a standard crystal and a sample crystal. CONSTITUTION:A standard crystal 16 and a sample crystal 17 to be measured are mounted on a goniometer 15. An X-ray beam emitted from an X-ray source 8 and applied simultaneously to the crystals 16 and 17 is made monochrome by a monochromator 10. Then angles of diffraction of diffracted beams generated when the X-ray beam is applied to the crystals 16 and 17 are detected. A plurality of crystals 11 and 12 of which the reflecting crystal faces are parallel to each other are disposed on the monochromator 10, on the occasion, and X-ray beams of different wavelengths lambda1 and lambda2 are applied to the crystals 16 and 17. An X-ray beam having a narrow wavelength width is obtained in this way, and the half-width of a diffraction intensity curve turns to be of a second order. Besides, precise measurement in a narrow angular range is attained and, in addition, an absolute value of a lattice constant can be determined. |
