Pulse discriminator and misprobe detector for digital logic tester probe

摘要

The logic circuit tester probe system described herein incorporates noise filter and data discrimination capability by comparing the duration of pulses received with the duration of the output of a one-shot. The probe system also incorporates misprobe detection capability which alerts the user that his probe is not making electrical contact with the circuit node under test whenever the input of the probe assumes the magnitude of a reference voltage rather than the magnitude of the voltage at the circuit node.