发明名称 Method of heat treatment of wafers
摘要 In a method of heat-treating a number of wafers each of which consists of a substance of poor heat conduction and a semiconductor layer formed on one surface of the substance, a method of heat treatment of wafers characterized in that the heat treatment is carried out under the state under which an auxiliary wafer made of a substance of good heat conduction is held in proximity to the other surface of the substance of poor heat conduction, whereby the wafers for the heat treatment are prevented from being cracked and have the characteristics made uniform.
申请公布号 US4016006(A) 申请公布日期 1977.04.05
申请号 US19760667452 申请日期 1976.03.16
申请人 HITACHI, LTD. 发明人 YOSHINAKA, AKIRA;AOSHIMA, TAKAAKI;SUGITA, YOSHIMITSU
分类号 C30B31/12;C30B33/00;H01L21/324;(IPC1-7):H01L21/32 主分类号 C30B31/12
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