发明名称 System for marking height levels along profile - using marking lines with varying line thickness cyclically repeated
摘要 <p>An arrangement to mark height levels along a profile in order to provide a map representation, using marking lines with the successive height levels being indicated by marking lines (2-4) of differing line thickness and the thickness of the lines being cyclically repeated. An auxiliary marking (1) is periodically marked along the length of the repeating line markings (2-4), and the distance between two auxiliary markings (1) is different to the distance over which one set of line markings (2-4) extends. The line markings can be provided along a parallel set of profile lines in order to provide a relief map representation.</p>
申请公布号 DE2635355(A1) 申请公布日期 1977.03.24
申请号 DE19762635355 申请日期 1976.08.06
申请人 JENOPTIK JENA GMBH 发明人 SCHUMANN,RUDOLF
分类号 G01C11/04;G09B29/12;(IPC1-7):01C11/00;09B29/00 主分类号 G01C11/04
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