发明名称 Linearity and flatness measuring probe with guide compensation - has laser beam detector on moving armature as reference
摘要 <p>The compensated measuring probe is designed to determine variations in linearity or flatness of a test specimen over which the probe is moved. The transducer comprises a hollow aluminum enclosure (5) which can be evacuated. A support frame on bearings has a cylinder (15) in which slides a piston attached to the probe stem (2). The piston is spring-loaded and its lower end is extended by a grating which moves in a slot between a light source and photoelectric sensor. The output drives a digital counter which displays the excursions of the probe. A laser beam is focussed onto a photoelectric sensor attached to a coil armature moving in a magnetic field. The sensor output is connected to the coils. The upper end of the armature cylinder carries the measuring photoelectric detector.</p>
申请公布号 DE2547478(B1) 申请公布日期 1977.03.24
申请号 DE19752547478 申请日期 1975.10.23
申请人 HEIDENHAIN GMBH DR JOHANNES 发明人 SPIES ALFONS DIPL-ING
分类号 G01B11/30;(IPC1-7):01B11/30 主分类号 G01B11/30
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