发明名称 |
Linearity and flatness measuring probe with guide compensation - has laser beam detector on moving armature as reference |
摘要 |
<p>The compensated measuring probe is designed to determine variations in linearity or flatness of a test specimen over which the probe is moved. The transducer comprises a hollow aluminum enclosure (5) which can be evacuated. A support frame on bearings has a cylinder (15) in which slides a piston attached to the probe stem (2). The piston is spring-loaded and its lower end is extended by a grating which moves in a slot between a light source and photoelectric sensor. The output drives a digital counter which displays the excursions of the probe. A laser beam is focussed onto a photoelectric sensor attached to a coil armature moving in a magnetic field. The sensor output is connected to the coils. The upper end of the armature cylinder carries the measuring photoelectric detector.</p> |
申请公布号 |
DE2547478(B1) |
申请公布日期 |
1977.03.24 |
申请号 |
DE19752547478 |
申请日期 |
1975.10.23 |
申请人 |
HEIDENHAIN GMBH DR JOHANNES |
发明人 |
SPIES ALFONS DIPL-ING |
分类号 |
G01B11/30;(IPC1-7):01B11/30 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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