发明名称 TESTING METHOD OF SUBSCRIBER LINE
摘要 PURPOSE:As for the exchange using semiconductor switch, the switch element is made to perform self maintain. As a result, the line test can be carried out with same accuracy as the exchange utilizing the mechanical contact.
申请公布号 JPS5235505(A) 申请公布日期 1977.03.18
申请号 JP19750111489 申请日期 1975.09.12
申请人 HITACHI LTD 发明人 MUKAEMACHI TAKUJI;FUKUSHIMA YUTAKA
分类号 H04M3/26;H04M3/30 主分类号 H04M3/26
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