发明名称 WAVE LENGTH SCANNER FOR SPECTROSCOPE
摘要 PURPOSE:In an optical system of the double spectroscopic sysytem which changes a prism and a plurality of diffraction gratings having different grid coefficients for use, it is intended to obtain a wave length scanner for a spectroscope, which is of simple construction and high accuracy, by driving a prism through a plurality of rotating members being formed corresponding to the grid coefficients of diffraction gratings.
申请公布号 JPS5230451(A) 申请公布日期 1977.03.08
申请号 JP19750105948 申请日期 1975.09.03
申请人 HITACHI LTD 发明人 MATSUMOTO KOUICHI;MAEDA YOSHIO;KURIMOTO KOUZOU
分类号 G01J3/06;G01J3/12 主分类号 G01J3/06
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