| 摘要 |
Apparatus in a high-density disk storage controller for qualitatively testing circuits recovering self-clocking data, on-line and independently of any storage device. The ability of the data recovery apparatus, which is designed with broad-tolerance circuits and components, to recover a data pattern having predetermined and worst-case phase-shift or jitter is tested dynamically under microprocessor control. The test results are evaluated and apparatus in the data recovery circuits selectively positions a read strobe precisely in the center of the data window to compensate for variations of delay encountered in different combinations of the broad-parameter components.
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