发明名称 ION DETECTING DEVICE FOR MASS SPECTOMETERS
摘要 PURPOSE:To apply high-speed periodical deflection to a collector slit and control the amount of deflection in inverse proportion to the mass of the ions being detected thereby substantially controlling the width of the collector slit.
申请公布号 JPS5220089(A) 申请公布日期 1977.02.15
申请号 JP19750095802 申请日期 1975.08.08
申请人 HITACHI LTD 发明人 KATOU YOSHIAKI
分类号 H01J49/30;G01N27/62 主分类号 H01J49/30
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