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发明名称
ION DETECTING DEVICE FOR MASS SPECTOMETERS
摘要
PURPOSE:To apply high-speed periodical deflection to a collector slit and control the amount of deflection in inverse proportion to the mass of the ions being detected thereby substantially controlling the width of the collector slit.
申请公布号
JPS5220089(A)
申请公布日期
1977.02.15
申请号
JP19750095802
申请日期
1975.08.08
申请人
HITACHI LTD
发明人
KATOU YOSHIAKI
分类号
H01J49/30;G01N27/62
主分类号
H01J49/30
代理机构
代理人
主权项
地址
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