| 摘要 |
The refractive index of the reflection suppressing passivating film is related to the refractive index of silicon in normal atmosphere. The relation meets a specified equation, and the film thickness is related to a given wavelength. - The passivating film (6) consists of silicon nitride. Preferably the film thickness is approximately 1000 A for white light. The film application reduces the high silicon reflection capacity, caused by its very high refractive index of approximately.
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