发明名称 METHOD AND OTDR APPARATUS FOR OPTICAL CABLE DEFECT LOCATION WITH REDUCED MEMORY REQUIREMENT
摘要 Optical time domain reflectometer (OTDR) systems, methods and integrated circuits are presented for locating defects in an optical cable or other optical cable, in which a first optical signal is transmitted to the cable and reflections are sampled over a first time range at a first sample rate to identify one or more suspected defect locations, and a second optical signal is transmitted and corresponding reflections are sampled over a second smaller time range at a higher second sample rate to identify at least one defect location of the optical cable for relaxed memory requirements in the OTDR system.
申请公布号 US2016258838(A1) 申请公布日期 2016.09.08
申请号 US201615156142 申请日期 2016.05.16
申请人 Texas Instruments Incorporated 发明人 Viswanathan Nagarajan
分类号 G01M11/00 主分类号 G01M11/00
代理机构 代理人
主权项 1. A method for locating defects in an optical cable, the method comprising: transmitting a first optical signal at a first location of the optical cable; sampling optical reflections at the first location of the optical cable at a first sample rate over a first time range following transmission of the first optical signal to obtain a first set of sample data corresponding to reflections of the first optical signal; identifying a first time in the first time range corresponding to a suspected defect location of the optical cable based at least partially on a temporal correlation of the first set of sample data with the transmitted first optical signal; transmitting a second optical signal at the first location of the optical cable; selectively sampling optical reflections at the first location of the optical cable at a second sample rate over a second time range following transmission of the second optical signal to obtain a second set of sample data corresponding to reflections of the second optical signal, the second time range including the first time, the second time range being less than the first time range, and the second sample rate being greater than the first sample rate; and identifying at least one defect location of the optical cable based at least partially on a temporal correlation of the second set of sample data with the transmitted second optical signal.
地址 Dallas TX US