发明名称 TESTPIECE AND METHOD FOR EVALUATING MECHANICAL AND PHYSICAL PROPERTIES OF CONDUCTIVE FILM
摘要 PURPOSE:To accurately detect the mechanical and physical properties of a film forming substance under a real condition by forming grip parts of both ends of an org. synthetic film having a conductive film formed to the surface layer thereof and measuring the resistance value of the conductive film when tensile load is applied to the film. CONSTITUTION:An org. synthetic film 2 such as a polyimide film is mounted on the aluminum substrate 6 fixed to a jig 10 and fixed by press metal fittings 11 while both end surfaces thereof are pulled and heated to be formed into a membrane in a predetermined forming process. Next, punching processing is applied to both ends of the film 2 so as to form the grip parts 3 engaged with the chucks 7 of a tensile tester 5 to form a test piece 4 to be evaluated. When the tensile strength of the test piece 4 is measured by the tester 5, the resistance value of the conductive film of the test piece 4 is measured at the same time by a measuring device 9 and the discontinuous increase point of the resistance value, that is, the strength at the time of the cutting-off of continuity due to a crack of the conductive film is read to evaluate the mechanical strength and elongation of the conductive film.
申请公布号 JPH03257342(A) 申请公布日期 1991.11.15
申请号 JP19900055055 申请日期 1990.03.08
申请人 FUJITSU LTD 发明人 SATO KAZUAKI;OKADA NOBUHIDE
分类号 G01N3/00;G01N1/28;G01N3/08;H05K1/00;H05K3/46 主分类号 G01N3/00
代理机构 代理人
主权项
地址