发明名称 IMPROVED METHOD AND APPARATUS FOR CONTACTING A WAFER
摘要 An improved mechanism for contacting and moving semiconductor wafers is provided. Specifically, a mechanism having a wafer contacting surface, such as a plurality of wafer lift pins, is driven from a first location (e.g., a wafer platform location) to a wafer contact location (e.g., where the wafer is initially contacted by the wafer lift pins, or where the wafer lift pins bring the wafer in contact with a wafer platform or wafer handler, etc.) via a Geneva drive mechanism having a plurality of stationary zones, a plurality of movement zones, and a plurality of transition points between the stationary zones and movement zones. The Geneva drive mechanism is configured such that as the wafer lift pins reach the wafer contact location the Geneva drive enters a stationary zone. Thus the wafer is contacted with virtually zero velocity.
申请公布号 WO9963583(A3) 申请公布日期 2000.02.10
申请号 WO1999US11271 申请日期 1999.05.21
申请人 APPLIED MATERIALS, INC. 发明人 PERLOV, ILYA;GANTVARG, EUGENE
分类号 F16H27/06;H01L21/677;H01L21/683;H01L21/687 主分类号 F16H27/06
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