| 摘要 |
PURPOSE:To conduct an efficient test by providing a means which separates a clock for putting the CPU part in operation and a clock for placing the peripheral part in operation with a signal which is inputted to one mode switching terminal (test terminal). CONSTITUTION:When the test terminal 8 is at 'L' level, the device is in a normal use state and selectors 11 and 12 supply clocks to the CPU part 6 and peripheral part 7 from an oscillation part 5. The test terminal 8 is set to 'H' level and then the selectors 11 and 12 are switched to supply the clock of the CPU part 6 from an input terminal 9 and the clock of the peripheral part 7 from an input terminal 10. Consequently, the CPU part 6 and peripheral part 7 operate individually and a redundant test pattern wherein the CPU part 6 and peripheral part are matched in cycle is not necessary, so that the test is conducted efficiently. |
