发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING RINSING AND DRYING SUBSTRATE WHERE FINE PATTERNS ARE FORMED
摘要 A method for fabricating a semiconductor device is provided to minimize formation of bridges between fine patterns by eliminating water remaining on a substrate using a drying agent containing fluorinated organic compound. A fine pattern is formed on a substrate(100) by using set etching solution, and then the substrate with the fine pattern is dried by using a drying agent containing a fluorinated organic compound. The fluorinated organic compound contains at least one selected from the group consisting of hydrofluoroether(HFE), hydroflurocarbon(HFC), and perflurocarbon(PFC). The substrate with the fine pattern is rinsed by deionized water.
申请公布号 KR20070094682(A) 申请公布日期 2007.09.21
申请号 KR20060025088 申请日期 2006.03.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH, JUNG MIN;KIM, SANG YONG;HAN, JEONG NAM;HONG, CHANG KI;LEE, KUN TACK
分类号 H01L21/306;H01L21/8242 主分类号 H01L21/306
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