| 摘要 |
An IC sorting handler and a method for controlling the same are provided to enhance work efficiency and productivity by increasing the number of devices to be tested per unit time. A burn-in board is loaded in a burn-in board loading unit in order to perform a burn-in test of a device. A loading unit(10) supplies the device from the outside to the burn-in board. A first test device(40) inspects the device before the device is loaded into the burn-in board. A second test device(50) inspects the device loaded in the burn-in board while a part of the device is supplied from the outside to the burn-in board. A bad product tray(75) is used for receiving the bad device according to the test results of one of the first and second test devices. |
