发明名称 Image inspection apparatus, image inspection method, and control program of image inspection apparatus
摘要 An image inspection apparatus for inspecting an output image on a recording medium by scanning the output image as a scanned image includes an inspection reference image generator to generate an inspection reference image using data of an output-target image; an image inspection unit to determine whether the scanned image includes a defect by comparing a difference between the inspection reference image and the scanned image with a given threshold; and a threshold determiner to determine the given threshold. The threshold determiner computes a difference between the inspection reference image and the scanned image. The threshold determiner determines the given threshold based on the difference between the scanned image and the inspection reference image.
申请公布号 US9390493(B2) 申请公布日期 2016.07.12
申请号 US201314026393 申请日期 2013.09.13
申请人 Ricoh Company, Ltd. 发明人 Kitai Tadashi;Masuda Noritaka
分类号 G06K9/00;G06T7/00;H04N1/60 主分类号 G06K9/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. An image inspection apparatus for inspecting an output image on a recording medium by scanning the output image as a scanned image, the image inspection apparatus comprising: processing circuitry configured to obtain data of an output-target image used by an image forming apparatus to conduct an image forming operation, and to generate an inspection reference image using the data of the output-target image, the inspection reference image to be used for an image inspection of the scanned image;determine whether the scanned image includes a defect based on a comparison result obtained by comparing a difference between the inspection reference image and the scanned image with a given threshold, anddetermine the given threshold, wherein the processing circuitry is further configured to generate the inspection reference image having a normal image condition to be used for determining the given threshold,compute a difference between the inspection reference image and the scanned image obtained by scanning a threshold setting image prepared by adding an artificial defect to the inspection reference image, anddetermine the given threshold based on the difference between the scanned image and the inspection reference image.
地址 Tokyo JP