发明名称 Overheating detection circuit for detecting overheating of a power device.
摘要 <p>An arrangement for detecting overheating of a power integrated circuit includes a power device integrated in a semiconductor substrate (11) and an overheating detection circuit. The overheating detection circuit includes a reverse biased pn junction (13, 16) formed in the same semiconductor substrate (11) as the power device and having a reverse leakage current flow which is temperature dependent, and a voltage convertor (2) formed in the same semiconductor substrate (11) as the power device and coupled to the pn junction (13, 16) for producing a voltage proportional to the reverse leakage current flow. A threshold circuit is connected for receiving the proportional voltage and producing a signal when the proportional voltage exceeds a threshold voltage (Vth) to indicate that the power device is overheated. &lt;IMAGE&gt; &lt;IMAGE&gt; &lt;IMAGE&gt;</p>
申请公布号 EP0488088(A1) 申请公布日期 1992.06.03
申请号 EP19910119989 申请日期 1991.11.22
申请人 FUJI ELECTRIC CO., LTD. 发明人 MASAHARU, NISHIURA, C/I FUJI ELECTRIC CO.,LTD.;TATSUHIKO, FUJIHIRA, C/I FUJI ELECTRIC CO.,LTD.
分类号 G01K3/00;G01K7/01 主分类号 G01K3/00
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