发明名称 |
Overheating detection circuit for detecting overheating of a power device. |
摘要 |
<p>An arrangement for detecting overheating of a power integrated circuit includes a power device integrated in a semiconductor substrate (11) and an overheating detection circuit. The overheating detection circuit includes a reverse biased pn junction (13, 16) formed in the same semiconductor substrate (11) as the power device and having a reverse leakage current flow which is temperature dependent, and a voltage convertor (2) formed in the same semiconductor substrate (11) as the power device and coupled to the pn junction (13, 16) for producing a voltage proportional to the reverse leakage current flow. A threshold circuit is connected for receiving the proportional voltage and producing a signal when the proportional voltage exceeds a threshold voltage (Vth) to indicate that the power device is overheated. <IMAGE> <IMAGE> <IMAGE></p> |
申请公布号 |
EP0488088(A1) |
申请公布日期 |
1992.06.03 |
申请号 |
EP19910119989 |
申请日期 |
1991.11.22 |
申请人 |
FUJI ELECTRIC CO., LTD. |
发明人 |
MASAHARU, NISHIURA, C/I FUJI ELECTRIC CO.,LTD.;TATSUHIKO, FUJIHIRA, C/I FUJI ELECTRIC CO.,LTD. |
分类号 |
G01K3/00;G01K7/01 |
主分类号 |
G01K3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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