发明名称 |
METHOD FOR INSPECTING APPEARANCE |
摘要 |
PURPOSE:To shorten a time required for the learning of a neural network or the selection of a feature value to be inputted at the time of inspecting appearance by means of the neural network. CONSTITUTION:After excluding an optional feature value or more out of plural feature values extracted from the image of a target to be inspected as feature values to be inputted to an input layer, the validity of the target to be inspected is discriminated and analyzed, and when a misdecision rate is increased as the result of discrimination, the excluded feature value is recognized as a feature value extremely relating to the discrimination/analysis of validity and selected, so that the feature value effective for the discrimination of validity can be selected and the learning of the neural network can rapidly be executed. |
申请公布号 |
JPH04222064(A) |
申请公布日期 |
1992.08.12 |
申请号 |
JP19900405720 |
申请日期 |
1990.12.25 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NAKAO SHINYA;YOKOYAMA HARUHIKO |
分类号 |
B41F33/14;B41J29/46;G01N21/88;G06F15/18;G06N3/00;G06N99/00;G06T1/00;G06T7/00 |
主分类号 |
B41F33/14 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|