发明名称 Integrated circuit having SiC layer
摘要 The present invention is related to an integrated circuit having an SiC etch stop layer fabricated using a method for removal of silicon carbide layers and in particular amorphous SiC of a substrate comprising the steps of: converting at least partly said exposed part of said carbide-silicon layer into an oxide-silicon layer by exposing said carbide-silicon layer to an oxygen containing plasma; and removing said oxide-silicon layer from said substrate.
申请公布号 US6806501(B2) 申请公布日期 2004.10.19
申请号 US20030359403 申请日期 2003.02.05
申请人 INTERUNIVERSTAIR MICROELEKTRONICA CENTRUM 发明人 VANHAELEMEERSCH SERGE;MEYNEN HERMAN;DEMBOWSKI PHILIP D.
分类号 H01L21/306;H01L21/311;H01L21/768;H01L23/522;(IPC1-7):H01L31/03 主分类号 H01L21/306
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