发明名称 ETCHING METHOD OF ALUMINUM
摘要 PURPOSE:To improve the etching resistance of a mask by a method wherein an organic film which can be easily formed and removed as the resist is used as a mask, together with the resist which is digested during an etching. CONSTITUTION:An Al film 2 is formed by a resistance heating on an electric insulation film 1 represented by an Si oxide film, and the organic film 6 and the resist 3 are formed thereon by a spin-coating. Next, the pattern of the resist 3 is formed after exposure and development, and thus the patterning of the organic film 6 is performed. Then, the Al film 2 is etched by using the pattern of the resist 3, and thereafter the organic film 6 is removed together with the resist 3.
申请公布号 JPS58140124(A) 申请公布日期 1983.08.19
申请号 JP19820023820 申请日期 1982.02.16
申请人 MATSUSHITA DENKI SANGYO KK 发明人 KUDOU HITOSHI
分类号 H01L21/302;H01L21/3065;(IPC1-7):01L21/302 主分类号 H01L21/302
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