发明名称 |
Aplanatic and quasi-aplanatic diffraction gratings |
摘要 |
A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnification across the optical aperture. The grating may be used, for example, in X-ray microscopes or telescopes of the imaging type and in X-ray microprobes. Increased spatial resolution and field of view may be realized in X-ray imaging.
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申请公布号 |
US4798446(A) |
申请公布日期 |
1989.01.17 |
申请号 |
US19870095715 |
申请日期 |
1987.09.14 |
申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY |
发明人 |
HETTRICK, MICHAEL C. |
分类号 |
G02B5/18;(IPC1-7):G01B5/18 |
主分类号 |
G02B5/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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