发明名称 Aplanatic and quasi-aplanatic diffraction gratings
摘要 A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnification across the optical aperture. The grating may be used, for example, in X-ray microscopes or telescopes of the imaging type and in X-ray microprobes. Increased spatial resolution and field of view may be realized in X-ray imaging.
申请公布号 US4798446(A) 申请公布日期 1989.01.17
申请号 US19870095715 申请日期 1987.09.14
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY 发明人 HETTRICK, MICHAEL C.
分类号 G02B5/18;(IPC1-7):G01B5/18 主分类号 G02B5/18
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