发明名称 TEST PATTERN GENERATION CIRCUIT
摘要 PURPOSE:To enable a weighted random pattern to be generated with an amount of circuit in a simple structure which is approximately equal to a normal random pattern generation circuit by generating a weighted pattern directly at each memory element. CONSTITUTION:A memory element which belongs to a group with a large target absolute value receives a signal with an increased absolute value through an A-type signal transfer circuit C0 based on a memory element which belongs to a group with a small target absolute value. On the contrary, a memory element which belongs to a group with a large target absolute value receives a signal with a smaller absolute value through B-type signal transfer circuits X0, X1, and X2 based on a signal of a memory element which belongs to a group with a large target absolute value. In this manner. no weighting is made according to an added weighting circuit based on an output of a pattern generator where 1 probability is 0.5 but a signal where a memory element within the pattern generator is weighted is directly generated, thus enabling a weighted random pattern to be generated with an amount of circuit in a simple structure.
申请公布号 JPH05134009(A) 申请公布日期 1993.05.28
申请号 JP19910295649 申请日期 1991.11.12
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 HENMI HITOSHI
分类号 G01R31/3183;G01R31/28;G06F11/22;H01L21/66;H01L27/00 主分类号 G01R31/3183
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