发明名称 SEMICONDUCTOR DEVICE, IC CARD AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To realize writing by a plurality of bit units such as byte writing for a memory using the memory cell of a multi-storage shape. SOLUTION: A memory gate electrode (33) is formed through a gate insulation film (31) and a gate nitride film (32) on a first semiconductor area (30), and first and second signal electrodes (38, 39) being first and second switch gate electrodes (36, 37) and a source and drain electrode are formed on both sides. The memory cell injects electrons from the source side to the gate nitride film to perform information storage. Since the memory gate electrode and the switch gate electrode are extended in the same direction, high voltage is applied on the memory gate electrode of the memory cell of a write object making the memory gate electrode and the switch gate electrode common, and even when writing and writing blocking voltage are given through the first and second signal electrodes are given, high electric field application is blocked by the switch gate electrode of a cut-off state in a writing non-selection memory cell.
申请公布号 JP2002164449(A) 申请公布日期 2002.06.07
申请号 JP20000362667 申请日期 2000.11.29
申请人 HITACHI LTD 发明人 KATAYAMA KOZO;KAMIGAKI YOSHIAKI;MINAMI SHINICHI
分类号 B42D15/10;G06K19/07;G06K19/077;G11C16/02;G11C16/04;G11C16/06;G11C16/10;G11C16/14;G11C16/26;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 B42D15/10
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