发明名称 |
THIN-FILM SEMICONDUCTOR SUBSTRATE, METHOD OF MANUFACTURING THIN-FILM SEMICONDUCTOR SUBSTRATE, METHOD OF CRYSTALLIZATION, APPARATUS FOR CRYSTALLIZATION, THIN-FILM SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THIN-FILM SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To obtain high reliability in the case of forming a semiconductor active device in the range of a large-size single-crystal semiconductor grain as obtained by a phase-modulation excimer laser crystallization method. SOLUTION: The thin-film semiconductor substrate comprises an insulative substrate 10, an amorphous semiconductor thin film 14 formed on the insulative substrate 10, and a plurality of alignment marks MK which are located on the semiconductor thin film 14 and are indicating the reference positions for crystallization. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005051208(A) |
申请公布日期 |
2005.02.24 |
申请号 |
JP20040174242 |
申请日期 |
2004.06.11 |
申请人 |
ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD |
发明人 |
HIRAMATSU MASAHITO;KIMURA YOSHINOBU;OGAWA HIROYUKI;JUMONJI MASAYUKI;MATSUMURA MASAKIYO |
分类号 |
H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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地址 |
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