发明名称 THIN-FILM SEMICONDUCTOR SUBSTRATE, METHOD OF MANUFACTURING THIN-FILM SEMICONDUCTOR SUBSTRATE, METHOD OF CRYSTALLIZATION, APPARATUS FOR CRYSTALLIZATION, THIN-FILM SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THIN-FILM SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain high reliability in the case of forming a semiconductor active device in the range of a large-size single-crystal semiconductor grain as obtained by a phase-modulation excimer laser crystallization method. SOLUTION: The thin-film semiconductor substrate comprises an insulative substrate 10, an amorphous semiconductor thin film 14 formed on the insulative substrate 10, and a plurality of alignment marks MK which are located on the semiconductor thin film 14 and are indicating the reference positions for crystallization. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005051208(A) 申请公布日期 2005.02.24
申请号 JP20040174242 申请日期 2004.06.11
申请人 ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD 发明人 HIRAMATSU MASAHITO;KIMURA YOSHINOBU;OGAWA HIROYUKI;JUMONJI MASAYUKI;MATSUMURA MASAKIYO
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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