发明名称 MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM AND METHOD FOR MANUFACTURING A DEVICE
摘要 <p>In some embodiments, a catoptric microlithgraphy projection optical system includes a plurality of reflective optical elements arranged to image radiation from an object field in an object plane to an image field in an image plane. The image field can have a size of at least 1 mm×1 mm. This optical system can have an object-image shift (OIS) of about 75 mm or less. Metrology and testing can be easily implemented despite rotations of the optical system about a rotation axis. Such a catoptric microlithgraphy projection optical system can be implemented in a microlithography tool. Such a microlithography tool can be used to produce microstructured components.</p>
申请公布号 EP2005249(A1) 申请公布日期 2008.12.24
申请号 EP20070702604 申请日期 2007.01.05
申请人 CARL ZEISS SMT AG 发明人 MANN, HANS-JUERGEN;ULRICH, WILHELM
分类号 G03F7/20 主分类号 G03F7/20
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