DEVICE FOR PROCESSING TROUBLES IN BOOTING IN SEMICONDUCTOR ELEMENT TEST BY USING PC MOTHER BOARD

摘要

PURPOSE: A device for processing the troubles in booting in a semiconductor element test by using a PC mother board is provided to perform booting regardless of the defects in a semiconductor element or such trouble as a contact error by inserting a reference good module to a slot before a slot inserted with an interface board. CONSTITUTION: Plural slots(slot0-slot3) for a test are installed in the PC mother board(11). The interface board(12) is connected to the slot for the use in the test via a connector(13). Many sockets(14) inserted with the semiconductor element are installed in the interface board. The reference good module(15) is inserted to the slot before the slot inserted with the interface board. The reference good module provides a condition in which a PC is booted all the time regardless of the defects in the semiconductor element to be tested or the contact error.