发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
摘要 To provide a semiconductor device with nonvolatile memory, having improved performance.;A memory cell has control and memory gate electrodes on a semiconductor substrate via an insulating film and another insulating film having first, second, and third films stacked one after another in order of mention, respectively. The memory and control gate electrodes are adjacent to each other via the stacked insulating film. The second insulating film has a charge accumulation function. The first and third insulating films each have a band gap greater than that of the second insulating film. An inner angle of the second insulating film between a portion extending between the semiconductor substrate and the memory gate electrode and a portion extending between the control gate electrode and the memory gate electrode is ≧90°. An inner angle of the corner portion between the lower surface and the side surface of the memory gate electrode is <90°.
申请公布号 US2016163882(A1) 申请公布日期 2016.06.09
申请号 US201615040935 申请日期 2016.02.10
申请人 Renesas Electronics Corporation 发明人 OWADA Fukuo
分类号 H01L29/792;H01L29/423;H01L27/115 主分类号 H01L29/792
代理机构 代理人
主权项
地址 Tokyo JP