发明名称 CURVE MATCHING AND PREQUALIFICATION
摘要 A system, method, and computer program product for evaluating a conformance of sets of curves using curvature information from curve segments to identify conforming curve segments. These curve segments are evaluated for relative positional variations in a context of a cluster by triangulating corresponding points among the curve segments of the cluster. Little to no deviation between corresponding lengths in the clusters indicate a high probability of match. Confirmation may be done by a more rigorous pattern matcher based upon the conforming curve segments of a cluster.
申请公布号 US2016253543(A1) 申请公布日期 2016.09.01
申请号 US201615053162 申请日期 2016.02.25
申请人 IDEX ASA 发明人 Bauchspies Roger A.
分类号 G06K9/00 主分类号 G06K9/00
代理机构 代理人
主权项 1. A machine-implemented pattern testing method comparing a first digital representation of a first pattern against a second digital representation of a second pattern to establish a measure of correspondence between the first pattern and the second pattern, comprising: mapping a first set of characteristic parameters derived from the first digital representation, said first set of characteristic parameters including a first plurality of discrete pattern elements and a first set of relative orientations between combinations of neighboring pattern elements of said first plurality of discrete pattern elements; mapping a second set of characteristic parameters derived from the second digital representation, said second set of characteristic parameters including a second plurality of discrete pattern elements and a first set of relative orientations between combinations of neighboring pattern elements of said second plurality of discrete pattern elements; defining, for each particular discrete pattern element of said first plurality of discrete pattern elements, a set of candidate discrete pattern elements from said second plurality of discrete pattern elements corresponding to said particular discrete pattern element; establishing a degree of correspondence for each said candidate discrete pattern element; and determining a figure of merit between said sets of characteristic parameters responsive to an analysis of said degrees of correspondence for said sets of candidate discrete patterns.
地址 Fornebu NO