发明名称 |
Non-volatile memory device and manufacturing method thereof |
摘要 |
A non-volatile memory device and a manufacturing method thereof are disclosed. The non-volatile memory device includes a gate insulating film formed on a semiconductor substrate, a floating gate formed on the gate insulating film, a dielectric film comprising a (TaO)1-x(TiO)xN film on the floating gate, and a control gate formed on the dielectric film. Thus, large charge capacitance values can be obtained compared to a similarly sized device using an ONO or Ta2O5 thin film dielectric while simultaneously simplifying the manufacturing process.
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申请公布号 |
US2002109142(A1) |
申请公布日期 |
2002.08.15 |
申请号 |
US20020121509 |
申请日期 |
2002.04.15 |
申请人 |
JOO KWANG CHUL;LEE KEE JEUNG |
发明人 |
JOO KWANG CHUL;LEE KEE JEUNG |
分类号 |
H01L21/8247;H01L21/28;H01L21/318;H01L27/115;H01L29/423;H01L29/51;H01L29/788;H01L29/792;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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