发明名称 Non-volatile memory device and manufacturing method thereof
摘要 A non-volatile memory device and a manufacturing method thereof are disclosed. The non-volatile memory device includes a gate insulating film formed on a semiconductor substrate, a floating gate formed on the gate insulating film, a dielectric film comprising a (TaO)1-x(TiO)xN film on the floating gate, and a control gate formed on the dielectric film. Thus, large charge capacitance values can be obtained compared to a similarly sized device using an ONO or Ta2O5 thin film dielectric while simultaneously simplifying the manufacturing process.
申请公布号 US2002109142(A1) 申请公布日期 2002.08.15
申请号 US20020121509 申请日期 2002.04.15
申请人 JOO KWANG CHUL;LEE KEE JEUNG 发明人 JOO KWANG CHUL;LEE KEE JEUNG
分类号 H01L21/8247;H01L21/28;H01L21/318;H01L27/115;H01L29/423;H01L29/51;H01L29/788;H01L29/792;(IPC1-7):H01L27/108 主分类号 H01L21/8247
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