发明名称 SCANNING TEST CIRCUIT AND METHOD FOR ARRANGING THE SAME
摘要 PROBLEM TO BE SOLVED: To facilitate adjustments of timings or optimizations of a layout design. SOLUTION: A replacement cell CELL1 is composed of a clock buffer CB1 and a flip-flop FF1 which latches data at a timing of falling edge of a clock signal. The final stage clock buffer positioned adjacent to a scan circuit and between the scan circuit and clock buffers which are cascaded to make up a clock tree, is replaced with the replacement cell CELL1, thereby facilitating the adjustments of the timings or the optimizations of the layout design. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006343151(A) 申请公布日期 2006.12.21
申请号 JP20050167278 申请日期 2005.06.07
申请人 TOSHIBA CORP 发明人 KAMATA TETSUO;SHIMIZU TAKASHI;SASAKI TORU
分类号 G01R31/28;H01L21/822;H01L27/04;H03K19/00 主分类号 G01R31/28
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