发明名称 Method for simultaneous patterning of features with nanometer scale gaps
摘要 A method of fabricating a pattern on a surface of a substrate includes applying at least one non-molecular lithographic technique with at least one molecular lithographic technique to simultaneously define a size and shape of at least one of the features of the pattern. The pattern includes a nanoscale gap between features, the gap having a width defined by the thickness of one or more molecular layers used in one of the molecular lithographic techniques.
申请公布号 US7432039(B2) 申请公布日期 2008.10.07
申请号 US20040979023 申请日期 2004.11.01
申请人 THE PENN STATE RESEARCH FOUNDATION 发明人 MC CARTY GREGORY S.;CATCHMARK JEFFREY M.;LAVALLEE GUY P.
分类号 G03F7/00;G03C5/00;G03F;H01L51/40 主分类号 G03F7/00
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