发明名称 INTEGRATED CIRCUIT PROCESS UTILIZING ORIENTATION DEPENDENT SILICON ETCH
摘要 Orientation-dependent etching is employed in the fabrication of a monolithic semiconductor circuit network to provide electrical isolation and increased packing density, while minimizing collector series resistance and output capacitance. Collector contact to a transistor component is made by the direct metallization of a buried low-resistivity substrate region exposed by the preferential etching operation.
申请公布号 US3659160(A) 申请公布日期 1972.04.25
申请号 USD3659160 申请日期 1970.02.13
申请人 TEXAS INSTRUMENTS INC. 发明人 BENJAMIN JOHNSTON SLOAN JR.;BILLY M. MARTIN;LOYD H. CLEVENGER;ROGER S. DUNN
分类号 H01L21/764;H01L23/535;(IPC1-7):H01L15/00 主分类号 H01L21/764
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