发明名称 Device for measuring parameters of an electronic device
摘要 The inherent capacitance between the substrate and the drain of an SOI device is utilized as part of a circuit. The substrate is connected to a sensing pin brought external to the chip, and other electronic components are hooked up to form a circuit that includes and operates with the inherent capacitance between the substrate and the drain.
申请公布号 US6876036(B2) 申请公布日期 2005.04.05
申请号 US20020202246 申请日期 2002.07.24
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 BOURDILLON LAURENCE A.
分类号 G01R31/26;H01L21/66;H01L27/12;H01L29/786;(IPC1-7):H01L27/01;H01L31/039 主分类号 G01R31/26
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