发明名称 |
Device for measuring parameters of an electronic device |
摘要 |
The inherent capacitance between the substrate and the drain of an SOI device is utilized as part of a circuit. The substrate is connected to a sensing pin brought external to the chip, and other electronic components are hooked up to form a circuit that includes and operates with the inherent capacitance between the substrate and the drain.
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申请公布号 |
US6876036(B2) |
申请公布日期 |
2005.04.05 |
申请号 |
US20020202246 |
申请日期 |
2002.07.24 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
BOURDILLON LAURENCE A. |
分类号 |
G01R31/26;H01L21/66;H01L27/12;H01L29/786;(IPC1-7):H01L27/01;H01L31/039 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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