发明名称 Method of manufacturing a memory integrated circuit device
摘要 A method of manufacturing a memory integrated circuit device including a memory cell region and a peripheral circuit region on a semiconductor substrate includes the steps of (a) forming a first groove in the memory cell region on the semiconductor substrate; (b) forming a second groove in the peripheral circuit region on the semiconductor substrate; and (c) forming a memory cell transistor in self-alignment with the first groove in the memory cell region and forming a peripheral circuit transistor in the peripheral circuit region using the second groove as an isolation groove. The steps (a) and (b) are performed simultaneously.
申请公布号 US6969663(B2) 申请公布日期 2005.11.29
申请号 US20030650072 申请日期 2003.08.28
申请人 FUJITSU LIMITED 发明人 TAKAHASHI KOJI
分类号 H01L21/76;H01L21/8234;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/088;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/76 主分类号 H01L21/76
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