发明名称 Vertical charge control semiconductor device
摘要 In accordance with an embodiment of the present invention, a MOSFET includes at least two insulation-filled trench regions laterally spaced in a first semiconductor region to form a drift region therebetween, and at least one resistive element located along an outer periphery of each of the two insulation-filled trench regions. A ratio of a width of each of the insulation-filled trench regions to a width of the drift region is adjusted so that an output capacitance of the MOSFET is minimized.
申请公布号 US6803626(B2) 申请公布日期 2004.10.12
申请号 US20020200056 申请日期 2002.07.18
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 SAPP STEVEN;WILSON PETER H.
分类号 H01L29/06;H01L29/40;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/06
代理机构 代理人
主权项
地址