| 摘要 |
PROBLEM TO BE SOLVED: To exactly detect a spot, where a through current is generated by an HiZ entry, in a logic simulation. SOLUTION: This device is provided with a floating deciding part 3 for detecting a spot, where the through current is generated by gate floating of an MOS transistor caused by an HiZ value entry making the output of a verification target cell into unfixed value, on the basis of a decision function F34 prepared from the circuit chart of a real device, which does not depend on the description of a library F3 for logic simulation in a verification target circuit.
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