TEST EQUIPMENT OF 133MHZ SDRAM AND TEST METHOD THEREOF

摘要

PURPOSE: A test equipment of 133mhz SDRAM and test method thereof is provided to measure 133MHz SDRAM using a 66MHz test equipment. CONSTITUTION: A test system measures 133MHz SDRAM(40) using a 66MHz test apparatus(10), and includes a clock division part(50). The clock division part receives different clock signals(CLK1,CLK2) and 2-divides the clock signals to output a divided clock signal(CLK3) to the 133MHz SDRAM. The clock signals(CLK1,CLK2) provided to the clock division part have a phase difference of 90 degree. The clock division part(50) consists of an exclusive OR(XOR) receiving the different clock signals.