发明名称 |
TEST PATTERN GENERATING DEVICE AND TEST PATTERN GENERATING METHOD |
摘要 |
An apparatus for LSI test has a risk place extraction unit supplied with a design information of the LSI to specify a place by estimating an error in LSI operation based on the design information of the LSI to write the place on a risk place list, and a pattern generator unit coupled to the risk extraction unit to generate a test pattern responsive to the risk place list, wherein the pattern generator unit generates the test pattern with an operation of the LSI being controlled to be lower than a predetermined threshold to prevent the error in LSI operation from occurring.
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申请公布号 |
US2008222473(A1) |
申请公布日期 |
2008.09.11 |
申请号 |
US20080014119 |
申请日期 |
2008.01.15 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
TAKU KAZUHIRO |
分类号 |
G06F11/263;G01R31/28;G06F11/25 |
主分类号 |
G06F11/263 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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