Verfahren zur materialdifferenzierenden elektronenmikroskopischen Abbildung isolierender Oberflaechen mit Hilfe von aus der abzubildenden Oberflaeche durch elektromagnetische Strahlung ausgeloesten Elektronen

摘要

Electron-microscopic projection method of surfaces using electrons freed by electro-magnetic radiation from the projected surfaces, suitable for mineral, glass ceramic and biological testing, features the provision of a coating which is thin in relation to the entry depth of the electrons after which electron microscope projection take places, retaining material differentiation.