| 摘要 |
<p>PURPOSE:To enhance general purpose applicability without depending on manual operation concerning retrieval measurement of output terminal information, by automatically measuring a large number of pieces of the information, to save testing labour and to shorten testing time, so as to test multiple kinds of LCD-driven IC devices, regarding improvement of a testing device of the liquid crystal-driven IC devices. CONSTITUTION:This device is provided with at least, a voltage generation source 11 to generate digital voltage VD, analog voltage VE and reference voltage VREF to be fed to a tested IC device 16, a scanning means 12 to scan and input output terminal information of the tested IC device 16, a signal measuring means 13 to measure the output terminal information of the tested IC device 16 and a control means 14 to control input and output of the voltage generation source 11, the scanning means 12 and the signal measurement means 13. This device is constituted so that the control means 14 carries out automatic measurement judgement processing of plural pieces of the output terminal information of the tested IC device 16 based on respective kinds of liquid crystal-driven modes STN/TFT, too.</p> |
