| 摘要 |
It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended according to a longitudinal direction between a contact tip and a contact head (30A, 30B), that contact probe (30) comprising at least one multilayer structure (31), in turn including a superposition of at least one inner layer or core (32) and a first inner coating layer (33), and an outer coating layer (35) that completely covers the multilayer structure (31) and made of a material having a higher hardness than a material realizing the core (32), that outer coating layer (35) also covering edge portions (34A, 34B) comprising the core (32) and the first inner coating layer (33). |
