| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method for analyzing the structure of crystal, capable of readily judging whether a spreading shape of a peak to be measured is decided by reflecting that a composition in the crystal is distributed nonuniformaly, when evaluating the crystal structure by X-ray diffraction. SOLUTION: The method for analyzing the structure of crystal includes a step of measuring profiles of a plurality of (hkl) reflections at a symmetrically reflecting position with respect to an X-ray incident angle (θ) and converting the profiles into a differenceΔΘ(abscissa axis) from a reference point, a step of converting the abscissa axis in accordance with the formula ofΔA(hkl)=--(2 a03/λ2h2)sin 2θB1(hkl)×Δθ(hkl), a step of making a graph obtained by plottingΔA (hkl) value of a feature point with respect to an amount (k2+12)/h2 calculated from an exponent (hkl), and a step of determining whether the graph is a straight line. Thus, by conducting decision theoretic analysis using the graph, a reply can be simply and surely given to the problem as to whether the spreading shape of the peak occurs due to a distribution of the composition.</p> |
