发明名称 THIN FILM SEMICONDUCTOR DEVICE AS WELL AS METHOD AND APPARATUS FOR MANUFACTURING POLYCRYSTAL SEMICONDUCTOR THIN FILM
摘要 <p>PURPOSE: To enhance a quality of a polycrystal semiconductor film formed on an insulating board. CONSTITUTION: A thin film semiconductor device comprises a gate electrode provided on a first semiconductor layer made of a polycrystal silicon film on the insulating board through a gate insulating film, a channel region provided on the semiconductor layer, a source region and a drain region disposed at both sides of the channel region in a MIS field effect transistor so that at least a main orientation of the channel region is a thin film in plane {110} with respect to the surface of the gate insulating film. Further, it is preferred that a polycrystal semiconductor film having a main orientation in plane {100} of a surface substantially perpendicular to a direction for coupling the source to the drain region is applied to the channel of the semiconductor device. The semiconductor device also comprises a polycrystal semiconductor film of a high quality in which a grain boundary, a grain size, a crystal orientation can be controlled and a roughness of a film and a crystal defect generated in a process of crystallization are reduced, on the insulating board.</p>
申请公布号 KR20020063472(A) 申请公布日期 2002.08.03
申请号 KR20010010416 申请日期 2001.02.28
申请人 HITACHI.LTD. 发明人 HATANO MUTSUKO;KIMURA YOSHINOBU;PARK, SEONG KEE;YAMAGUCHI SHINYA
分类号 H01L29/786;C30B1/00;H01L21/00;H01L21/20;H01L21/26;H01L21/324;H01L21/336;H01L21/36;H01L21/42;H01L21/44;H01L21/4763;H01L21/477;H01L21/84;H01L23/62;H01L27/01;H01L27/12;H01L31/0328;H01L31/0336;H01L31/0392;H01L31/072;H01L31/109;(IPC1-7):H01L29/786 主分类号 H01L29/786
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