Semiconductor integrated circuit device with test circuit

摘要

A semiconductor integrated circuit device includes a memory circuit and a flag generator. The memory circuit is a circuit with a test circuit and includes a redundant circuit. The flag generator loads compared result information serially output from the memory circuit, and outputs flag signals if the compared result information includes at least one piece of mismatch information. This makes it possible to solve a problem of a conventional semiconductor integrated circuit device in that it takes a long time for carrying out a fault test of bits constituting the memory circuit.