发明名称 |
FinFETs and methods for forming the same |
摘要 |
A finFET and methods for forming a finFET are disclosed. A structure comprises a substrate, a fin, a gate dielectric, and a gate electrode. The substrate comprises the fin. The fin has a major surface portion of a sidewall, and the major surface portion comprises at least one lattice shift. The at least one lattice shift comprises an inward or outward shift relative to a center of the fin. The gate dielectric is on the major surface portion of the sidewall. The gate electrode is on the gate dielectric. |
申请公布号 |
US9349841(B2) |
申请公布日期 |
2016.05.24 |
申请号 |
US201514625848 |
申请日期 |
2015.02.19 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Huang Yu-Lien;Fan Chun-Hsiang;Perng Tsu-Hsiu;Liu Chi-Kang;Li Yung-Ta;Tsai Ming-Huan;Wann Clement Hsingjen;Liu Chi-Wen |
分类号 |
H01L29/34;H01L29/66;H01L29/78;H01L21/306;H01L21/324;H01L29/06 |
主分类号 |
H01L29/34 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A method comprising:
forming a fin on a substrate; after forming the fin, re-shaping the fin to have a surface portion of each sidewall of the fin with a plurality of lattice shift locations, the surface portion of each sidewall extending from the to of each sidewall, each of the plurality of lattice shift locations comprising an inward or outward shift relative to a center of the fin; forming a dielectric on the surface portion of the sidewall; and forming a gate electrode on the dielectric. |
地址 |
Hsin-Chu TW |