发明名称 Integrated circuit devices including contacts and methods of forming the same
摘要 Integrated circuit devices including contacts and methods of forming the same are provided. The devices may include a fin on a substrate, a gate structure on the fin and a source/drain region in the fin at a side of the gate structure. The devices may further include a contact plug covering an uppermost surface of the source/drain region and a sidewall of the gate structure. The contact plug may include an inner portion including a first material and an outer portion including a second material different from the first material. The outer portion may at least partially cover a sidewall of the inner portion, and a portion of the outer portion may be disposed between the sidewall of the gate structure and the sidewall of the inner portion.
申请公布号 US9431492(B2) 申请公布日期 2016.08.30
申请号 US201514628541 申请日期 2015.02.23
申请人 Samsung Electronics Co., Ltd. 发明人 Kittl Jorge A.;Palle Dharmendar Reddy;Rodder Mark S.
分类号 H01L29/45;H01L29/417;H01L27/088;H01L29/78;H01L27/12;H01L21/768;H01L23/485 主分类号 H01L29/45
代理机构 Myers Bigel & Sibley, P.A. 代理人 Myers Bigel & Sibley, P.A.
主权项 1. An integrated circuit device, comprising: a fin on a substrate; first and second gate structures on the fin, wherein sidewalls of the first and second gate structures define a recess therebetween; a source/drain region in the fin between the first and second gate structures; and a contact plug on the source/drain region and in the recess, the contact plug comprising an inner portion comprising a first material and an outer portion comprising a second material different from the first material, wherein: the inner portion of the contact plug contacts the source/drain region; the outer portion at least partially covers a sidewall of the inner portion; and a portion of the outer portion is disposed between the sidewall of the first gate structure and the sidewall of the inner portion.
地址 KR